Laser Beam Profiler 190nm-950nm

Laser beam profilier from Ophir Photonics with NIST tracecable calibration. Scanning slit design allows measurement of wavelengths from 190nm to greater then 100µm. Fast measurement with beam being acquired in less then 300ms with an update rate of 20Hz. Laser beam profiler can measure both pulsed and CW laser outputs. Easy to setup and use laser beam profiler for high accuracy applications.